Aiming to become the global leader in chip-scale photonic solutions by deploying Optical Interposer technology to enable the seamless integration of electronics and photonics for a broad range of vertical market applications

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Message: When?

Someone recently asked here (forgot who) for a further refinement on the answer of how this 5000 hours of testing can be accomplished. If I may, I think he was asking if it was possible to accelerate the testing in a non-linear fashion. In other words, have different aspects of the test performed simultaneously somehow. If it was being subdivided across four testing stations, that would mean the 5000 hours of testing could be accomplished in 1250 hours. 

Is this approach feasible?

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